Near-edge x-ray absorption fine structure measurements...

Journal of Physics D Applied Physics 2008 / 05 Vol. 41; Iss. 10

Near-edge x-ray absorption fine structure measurements using a laboratory-scale XUV source

Peth, Christian, Barkusky, Frank, Mann, Klaus
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Volume:
41
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/41/10/105202
Date:
May, 2008
File:
PDF, 682 KB
english, 2008
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