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Photoelectric characteristics of silicon P—N junction with nanopillar texture: Analysis of X-ray photoelectron spectroscopy
Liu, Jing, Wang, Jia-Ou, Yi, Fu-Ting, Wu, Rui, Zhang, Nian, Ibrahim, KurashVolume:
23
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/23/9/096101
Date:
September, 2014
File:
PDF, 911 KB
english, 2014