High-Resolution Scanning Electron Microscopy Observation of...

Japanese Journal of Applied Physics 2004 / 3 Vol. 43; Iss. 3

High-Resolution Scanning Electron Microscopy Observation of GaN/AlGaN Strained-Layer Superstructures in GaN-Based Violet Laser Diodes

Saijo, Hiroshi, Nakagawa, Mine, Yamada, Mitsuhiko, Hsu, Jung-Tsung, Tu, Ru-Chin, Yang, Jer-Ren, Shiojiri, Makoto
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Volume:
43
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.43.968
Date:
March, 2004
File:
PDF, 98 KB
english, 2004
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