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A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy
Malte Behrens, Jan Tomforde, Enno May, Ragnar Kiebach, Wolfgang Bensch, Dietrich Häußler, Wolfgang JägerVolume:
179
Year:
2006
Language:
english
Pages:
8
DOI:
10.1016/j.jssc.2006.06.024
File:
PDF, 544 KB
english, 2006