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[IEEE International Semiconductor Conference - Sinaia, Romania (8-12 Oct. 2002)] Proceedings. International Semiconductor Conference - Micro and nanoelectrode voltammetric measurements
Simion, M., Iorgulescu, E.E., Angelescu, A., Kleps, I., Miu, M., Bragaru, A.Year:
2002
Language:
english
DOI:
10.1109/smicnd.2002.1105815
File:
PDF, 307 KB
english, 2002