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Evaluation of Seebeck coefficients in n- and p-type silicon nanowires fabricated by complementary metal–oxide–semiconductor technology
Hyun, Younghoon, Park, Youngsam, Choi, Wonchul, Kim, Jaehyeon, Zyung, Taehyoung, Jang, MoongyuVolume:
23
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/23/40/405707
Date:
October, 2012
File:
PDF, 1.81 MB
english, 2012