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[IEEE 2014 47th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO) - Cambridge, United Kingdom (2014.12.13-2014.12.17)] 2014 47th Annual IEEE/ACM International Symposium on Microarchitecture - Voltage Noise in Multi-Core Processors: Empirical Characterization and Optimization Opportunities
Bertran, Ramon, Buyuktosunoglu, Alper, Bose, Pradip, Slegel, Timothy J., Salem, Gerard, Carey, Sean, Rizzolo, Richard F., Strach, ThomasYear:
2014
Language:
english
DOI:
10.1109/micro.2014.12
File:
PDF, 1.63 MB
english, 2014