In-situ high-resolution low energy electron diffraction study of strain relaxation in heteroepitaxy of Bi(111) on Si(001): Interplay of strain state, misfit dislocation array and lattice parameter
Hattab, H., Jnawali, G., Horn-von Hoegen, M.Volume:
570
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2014.08.013
Date:
November, 2014
File:
PDF, 727 KB
english, 2014