[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Effects of gamma-ray irradiation and electrical stress on ZnO thin film transistors
Ramirez, J. Israel, Li, Yuanyuan V., Basantani, Hitesh, Jackson, Thomas N.Year:
2013
Language:
english
DOI:
10.1109/drc.2013.6633848
File:
PDF, 412 KB
english, 2013