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Fundamentals of X-ray Diffraction Characterisation of Strain in GaN Based Compounds
Oehler, Fabrice, Vickers, Mary E., Kappers, Menno J., Humphreys, Colin J., Oliver, Rachel A.Volume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/jjap.52.08jb29
Date:
August, 2013
File:
PDF, 556 KB
english, 2013