MEASUREMENT OF NANOMECHANICAL PROPERTIES OF THIN FILMS BY...

MEASUREMENT OF NANOMECHANICAL PROPERTIES OF THIN FILMS BY INTEGRATING NANOINDENTATION SYSTEM AND ATOMIC FORCE MICROSCOPE

CHAO, LU-PING, HSU, JOING-SHIUN, LAU, YUNG-DONG
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Volume:
6
Language:
english
Journal:
International Journal of Nanoscience
DOI:
10.1142/S0219581X07004237
Date:
February, 2007
File:
PDF, 338 KB
english, 2007
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