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[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - Future challenges and opportunities for heterogeneous process technology. Towards the thin films, Zero Intrinsic Variability devices, Zero Power era
Deleonibus, S., Faynot, O., Ernst, T., Vinet, M., Batude, P., Andrieu, F., Weber, O., Cooper, D., Bertin, F., Moriceau, H., DiCioccio, L., Signamarcheix, T., Sanquer, M., Jehl, X., Cueto, O., Fanet, HYear:
2014
Language:
english
DOI:
10.1109/iedm.2014.7047015
File:
PDF, 2.57 MB
english, 2014