[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - Pulsed cycling operation and endurance failure of metal-oxide resistive (RRAM)
Balatti, S., Ambrogio, S., Wang, Z.-Q., Sills, S., Calderoni, A., Ramaswamy, N., Ielmini, D.Year:
2014
Language:
english
DOI:
10.1109/IEDM.2014.7047050
File:
PDF, 896 KB
english, 2014