Evaluating Origin of Electron Traps in...

Japanese Journal of Applied Physics 2008 / 3 Vol. 47; Iss. 3

Evaluating Origin of Electron Traps in Tris(8-hydroxyquinoline) Aluminum Thin Films using Thermally Stimulated Current Technique

Matsushima, Toshinori, Adachi, Chihaya
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Volume:
47
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.47.1748
Date:
March, 2008
File:
PDF, 259 KB
english, 2008
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