All-Digital Duty-Cycle Corrector With a Wide Duty Correction Range for DRAM Applications
Jeong, Chan-Hui, Abdullah, Ammar, Min, Young-Jae, Hwang, In-Chul, Kim, Soo-WonYear:
2015
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2015.2394486
File:
PDF, 2.48 MB
english, 2015