High resolution x-ray diffraction methods for the...

High resolution x-ray diffraction methods for the structural characterisation of crystalline materials

Chrosch, Jutta, Salje, Ekhard K.H.
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Volume:
187
Language:
english
Journal:
Ferroelectrics
DOI:
10.1080/00150199608244839
Date:
October, 1996
File:
PDF, 643 KB
english, 1996
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