Time-of-Flight pulsed ion beam surface analysis as a means of in situ , real-time characterization of the growth of ferro-electric and conductive oxide heterostructures
Krauss, A. R., Auciello, O., Lin, Y., Chang, R.P. H., Gruen, D. M.Volume:
8
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589508012307
Date:
March, 1995
File:
PDF, 766 KB
english, 1995