Time-of-Flight pulsed ion beam surface analysis as a means...

Time-of-Flight pulsed ion beam surface analysis as a means of in situ , real-time characterization of the growth of ferro-electric and conductive oxide heterostructures

Krauss, A. R., Auciello, O., Lin, Y., Chang, R.P. H., Gruen, D. M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
8
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589508012307
Date:
March, 1995
File:
PDF, 766 KB
english, 1995
Conversion to is in progress
Conversion to is failed