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[IEEE 2007 International Conference on Wavelet Analysis and Pattern Recognition - Beijing, China (2007.11.2-2007.11.4)] 2007 International Conference on Wavelet Analysis and Pattern Recognition - A novel approach to image denoising using the Pareto optimal curvelet thresholds

Yi-Feng Niu,, Lin-Cheng Shen,
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Year:
2007
Language:
english
DOI:
10.1109/icwapr.2007.4420745
File:
PDF, 1.03 MB
english, 2007
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