Direct Observation of Charge Carrier Diffusion and...

Japanese Journal of Applied Physics 2013 / 08 Vol. 52; Iss. 8S

Direct Observation of Charge Carrier Diffusion and Localization in an InGaN Multi Quantum Well

Solowan, Hans-Michael, Danhof, Julia, Schwarz, Ulrich T.
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Volume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.52.08JK07
Date:
August, 2013
File:
PDF, 540 KB
english, 2013
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