Carrier Density Dependent Localization and Consequences for Efficiency Droop in InGaN/GaN Quantum Well Structures
Badcock, Tom J., Hammersley, Simon, Watson-Parris, Duncan, Dawson, Phil, Godfrey, Mike J., Kappers, Menno J., McAleese, Clifford, Oliver, Rachel A., Humphreys, Colin J.Volume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.52.08JK10
Date:
August, 2013
File:
PDF, 381 KB
english, 2013