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Point defect determination by photoluminescence and capacitance—voltage characterization in a GaN terahertz Gunn diode
Li, Liang, Yang, Lin-An, Zhou, Xiao-Wei, Zhang, Jin-Cheng, Hao, YueVolume:
22
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/22/8/087104
Date:
August, 2013
File:
PDF, 627 KB
english, 2013