Measuring the critical thickness of thin metalorganic...

Measuring the critical thickness of thin metalorganic precursor films

Roeder, Ryan K., Slamovich, Elliott B.
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Volume:
14
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.1999.0315
Date:
June, 1999
File:
PDF, 228 KB
english, 1999
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