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[IEEE 2014 Conference on Optoelectronic and Microelectronic Materials & Devices (COMMAD) - Perth, Australia (2014.12.14-2014.12.17)] 2014 Conference on Optoelectronic and Microelectronic Materials & Devices - Indium tin oxide film characterization using the classical Hall Effect
van Beveren, L.H. Willems, Panchenko, E., Anachi, N., Hyde, L., Smith, D., James, T.D., Roberts, A., McCallum, J.C.Year:
2014
Language:
english
DOI:
10.1109/COMMAD.2014.7038675
File:
PDF, 168 KB
english, 2014