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Scaling constraints in nanoelectronic random-access memories
Amsinck, Christian J, Spigna, Neil H Di, Nackashi, David P, Franzon, Paul DVolume:
16
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/16/10/047
Date:
October, 2005
File:
PDF, 740 KB
english, 2005