Hot-carrier effects on irradiated deep submicron NMOSFET

Journal of Semiconductors 2014 / 07 Vol. 35; Iss. 7

Hot-carrier effects on irradiated deep submicron NMOSFET

Cui, Jiangwei, Zheng, Qiwen, Yu, Xuefeng, Cong, Zhongchao, Zhou, Hang, Guo, Qi, Wen, Lin, Wei, Ying, Ren, Diyuan
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Volume:
35
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/35/7/074004
Date:
July, 2014
File:
PDF, 921 KB
english, 2014
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