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Studies of the effects of addition of P and Cr on microstructure and electrical resistivity of nanocrystalline CoFe thin films
Taslimi, H., Heydarzadeh Sohi, M., Mehrizi, S., Saremi, M.Volume:
26
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-015-2783-z
Date:
May, 2015
File:
PDF, 2.11 MB
english, 2015