Rapid thermal annealing effects on the electrical,...

Electronic Materials Letters 2015 / 1 Vol. 11; Iss. 1

Rapid thermal annealing effects on the electrical, structural and morphological properties of Yb/p-type InP Schottky Structure

Rajagopal Reddy, V., Sri Silpa, D., Janardhanam, V., Yun, Hyung-Joong, Choi, Chel-Jong
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Volume:
11
Language:
english
Journal:
Electronic Materials Letters
DOI:
10.1007/s13391-014-1368-y
Date:
January, 2015
File:
PDF, 1.34 MB
english, 2015
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