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Thermal characteristics investigation of high voltage grounded gate-LDMOS under ESD stress conditions
Weifeng, Sun, Qinsong, Qian, Wen, Wang, Yangbo, YiVolume:
30
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/30/10/104004
Date:
October, 2009
File:
PDF, 673 KB
english, 2009