Measurement accuracy analysis of the free carrier...

Chinese Physics B 2011 / 06 Vol. 20; Iss. 6

Measurement accuracy analysis of the free carrier absorption determination of the electronic transport properties of silicon wafers

Zhang, Xi-Ren, Gao, Chun-Ming, Zhou, Ying, Wang, Zhan-Ping
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Volume:
20
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/20/6/068105
Date:
June, 2011
File:
PDF, 54 KB
english, 2011
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