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Characterization of tetragonal distortion in a thick Al 0.2 Ga 0.8 N epilayer with an AlN interlayer by Rutherford backscattering/channeling
Wang, Huan, Yao, Shu-DeVolume:
23
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/23/9/096801
Date:
September, 2014
File:
PDF, 283 KB
english, 2014