Structural characterization of V/Al/V/Au Ohmic contacts to...

Chinese Physics B 2011 / 04 Vol. 20; Iss. 4

Structural characterization of V/Al/V/Au Ohmic contacts to n-type Al 0.4 Ga 0.6 N

Li, Tao, Qin, Zhi-Xin, Xu, Zheng-Yu, Shen, Bo, Zhang, Guo-Yi
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Volume:
20
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/20/4/046101
Date:
April, 2011
File:
PDF, 2.80 MB
english, 2011
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