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Incident particle range dependence of radiation damage in a power bipolar junction transistor
Liu, Chao-Ming, Li, Xing-Ji, Geng, Hong-Bin, Rui, Er-Ming, Guo, Li-Xin, Yang, Jian-QunVolume:
21
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/21/10/104211
Date:
October, 2012
File:
PDF, 54 KB
english, 2012