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An accurate method for predicting temperature-dependent current mismatch in weak inversion region of long and wide channel MOSFET without subthreshold hump
Sakakibara, Kiyohiko, Arimoto, KazutamiVolume:
53
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.53.064305
Date:
June, 2014
File:
PDF, 2.80 MB
english, 2014