Simulation study of conductive filament growth dynamics in...

Journal of Semiconductors 2014 / 10 Vol. 35; Iss. 10

Simulation study of conductive filament growth dynamics in oxide-electrolyte-based ReRAM

Sun, Pengxiao, Liu, Su, Li, Ling, Liu, Ming
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Volume:
35
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/35/10/104007
Date:
October, 2014
File:
PDF, 605 KB
english, 2014
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