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Two-dimensional analysis of the interface state effect on current gain for a 4H–SiC bipolar junction transistor
You-Run, Zhang, Bo, Zhang, Zhao-Ji, Li, Xiao-Chuan, DengVolume:
19
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/19/6/067102
Date:
June, 2010
File:
PDF, 211 KB
english, 2010