[IEEE 2014 International Conference on Information Science, Electronics and Electrical Engineering (ISEEE) - Sapporo, Japan (2014.4.26-2014.4.28)] 2014 International Conference on Information Science, Electronics and Electrical Engineering - Electrical and reliability performances of stacked HfO2/Al2O3 MOS-HEMTs
Chou, Bo-Yi, Liu, Han-Yin, Hsu, Wei-Chou, Lee, Ching-Sung, Wu, Yu-Sheng, Yao, En-PingYear:
2014
Language:
english
DOI:
10.1109/infoseee.2014.6947814
File:
PDF, 122 KB
english, 2014