A robust and simple two-mode digital calibration technique...

Journal of Semiconductors 2011 / 03 Vol. 32; Iss. 3

A robust and simple two-mode digital calibration technique for pipelined ADC

Yin, Xiumei, Zhao, Nan, Sekedi, Bomeh Kobenge, Yang, Huazhong
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Volume:
32
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/32/3/035001
Date:
March, 2011
File:
PDF, 908 KB
english, 2011
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