Low Cost Built-in Sensor Testing of Phase-Locked Loop...

Low Cost Built-in Sensor Testing of Phase-Locked Loop Dynamic Parameters

Hsiao, Sen-Wen, Wang, Xian, Chatterjee, Abhijit
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
30
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-014-5474-4
Date:
October, 2014
File:
PDF, 6.04 MB
english, 2014
Conversion to is in progress
Conversion to is failed