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Low Cost Built-in Sensor Testing of Phase-Locked Loop Dynamic Parameters
Hsiao, Sen-Wen, Wang, Xian, Chatterjee, AbhijitVolume:
30
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-014-5474-4
Date:
October, 2014
File:
PDF, 6.04 MB
english, 2014