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Copper diffusion in germanium: connecting point defect parameters with bulk properties
Chroneos, A., Panayiotatos, Y., Vovk, R. V.Volume:
26
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-015-2744-6
Date:
May, 2015
File:
PDF, 285 KB
english, 2015