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Effect of film thickness and annealing on optical properties of TiO2thin films and electrical characterization of MOS capacitors
Vishwas, M., Narasimha Rao, K., Chakradhar, R. P. S., Raichur, Ashok M.Volume:
25
Language:
english
Journal:
Journal of Materials Science: Materials in Electronics
DOI:
10.1007/s10854-014-2193-7
Date:
October, 2014
File:
PDF, 763 KB
english, 2014