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ECS Transactions [ECS 217th ECS Meeting - Vancouver, Canada (April 25 - April 30, 2010)] - (Invited) High Performance and Highly Uniform Metal Hi-K Gate-All-Around Silicon Nanowire MOSFETs
Sleight, Jeffrey W., Bangsaruntip, Sarunya, Cohen, Guy, Majumdar, Amlan, Zhang, Ying, Engelmann, Sebastian, Fuller, Nicholas, Gignac, Lynne, Mittal, Surbhi, Newbury, Joseph, Barwicz, Tymon, Frank, MarYear:
2010
Language:
english
DOI:
10.1149/1.3375600
File:
PDF, 3.24 MB
english, 2010