Novel LDNMOS embedded SCR with strong ESD robustness based...

Journal of Central South University 2015 / 2 Vol. 22; Iss. 2

Novel LDNMOS embedded SCR with strong ESD robustness based on 0.5 μm 18 V CDMOS technology

Wang, Yang, Jin, Xiang-liang, Zhou, A-cheng
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Volume:
22
Language:
english
Journal:
Journal of Central South University
DOI:
10.1007/s11771-015-2555-1
Date:
February, 2015
File:
PDF, 2.03 MB
english, 2015
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