[IEEE 2005 42nd Design Automation Conference - Anaheim, CA,...

  • Main
  • [IEEE 2005 42nd Design Automation...

[IEEE 2005 42nd Design Automation Conference - Anaheim, CA, USA (2005.06.13-2005.06.17)] Proceedings. 42nd Design Automation Conference, 2005. - Secure scan: a design-for-test architecture for crypto chips

Bo Yang,, Kaijie Wu,, Karri, R.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2005
Language:
english
DOI:
10.1109/dac.2005.193787
File:
PDF, 1.04 MB
english, 2005
Conversion to is in progress
Conversion to is failed