An Extended Direct Power Injection Method for In-Place Susceptibility Characterization of VLSI Circuits Against Electromagnetic Interference
Sawada, Takuya, Yoshikawa, Kumpei, Takata, Hidehiro, Nii, Koji, Nagata, MakotoYear:
2014
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2014.2361208
File:
PDF, 1.46 MB
english, 2014