[ECS 214th ECS Meeting - Honolulu, HI (October 12 - October 17, 2008)] ECS Transactions - Polarity Change of Threshold Voltage Shifts for n-channel Polycrystalline Silicon Thin-Film Transistors Stressed by Negative Gate Bias
Huang, Ching-Fang, Yang, Ying-Jhe, Peng, Cheng-Yi, Sun, Hung-Chang, Liu, Chee Wee, Hsu, Yuan-Chun, Shih, Ching-Chien, Chen, Jim-ShoneVolume:
16
Year:
2008
Language:
english
DOI:
10.1149/1.2986764
File:
PDF, 145 KB
english, 2008