[ECS 216th ECS Meeting - Vienna, Austria (October 4 -...

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[ECS 216th ECS Meeting - Vienna, Austria (October 4 - October 9, 2009)] ECS Transactions - Advanced Application of Resistivity and Hall Effect Measurements to Characterization of Silicon

Voronkov, Vladimir V., Voronkova, Galina I., Batunina, Anna V., Falster, Robert
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Year:
2009
Language:
english
DOI:
10.1149/1.3204391
File:
PDF, 382 KB
english, 2009
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