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[IEEE 2014 20th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) - Greenwich, London, United Kingdom (2014.9.24-2014.9.26)] 20th International Workshop on Thermal Investigations of ICs and Systems - Thermal transient measurement of insulated gate devices using the thermal properties of the channel resistance and parasitic elements
Farkas, Gabor, Purak, Tivadar, Toth, GergelyYear:
2014
Language:
english
DOI:
10.1109/therminic.2014.6972517
File:
PDF, 10.11 MB
english, 2014