Noise sensitivity of the exponential histogram ADC test

Measurement 2006 Vol. 39; Iss. 3

Noise sensitivity of the exponential histogram ADC test

Ján Šaliga, Linus Michaeli, Roland Holcer
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Volume:
39
Year:
2006
Language:
english
Pages:
7
DOI:
10.1016/j.measurement.2005.11.004
File:
PDF, 573 KB
english, 2006
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