ECS Transactions [ECS China Semiconductor Technology International Conference 2011 (CSTIC 2011) - Shanghai, China (March 13 - March 14, 2011)] - Failure Mechanism and Testing of PCB Pad Cratering
Xie, Dongji, Cai, Miao, Wu, Boyi, Geiger, David, Shangguan, Dongkai, Martin, IvanYear:
2011
Language:
english
DOI:
10.1149/1.3567705
File:
PDF, 273 KB
english, 2011