X-ray diffraction measurement of residual stress in...

Mechanics Research Communications 2011 Vol. 38; Iss. 3

X-ray diffraction measurement of residual stress in epitaxial ZnO/α-Al2O3 thin film

Farid Takali, Anouar Njeh, Hartmut Fuess, Mohamed Hédi Ben Ghozlen
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Volume:
38
Year:
2011
Language:
english
Pages:
6
DOI:
10.1016/j.mechrescom.2011.02.008
File:
PDF, 463 KB
english, 2011
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